Optics: measuring and testing – For optical fiber or waveguide inspection
Patent
1995-04-27
1996-11-26
Hantis, K.
Optics: measuring and testing
For optical fiber or waveguide inspection
356312, 356316, 356326, B01N 2100
Patent
active
055791042
ABSTRACT:
A spectroscopic apparatus applicable to both ICP (inductively coupled plasma) emission spectroscopy and atomic absorption spectrometry is provided. The spectroscopic apparatus includes a sample unit on which a plasma torch for ICP emission spectroscopy and a heating tube for atomic absorption spectrometry are mounted. A control unit shifts the sample unit to place a plasma flame that is on an end of the plasma torch in front of the light inlet of a spectroscopic unit when the apparatus is operating in the ICP emission spectroscopic mode and to place a central axis of the heating tube in front of the light inlet when the apparatus is operating in the atomic absorption spectrometric mode. The control unit also shifts the apparatus to a two stage spectral mode for ICP emission spectroscopy and to a one stage spectral mode for atomic absorption spectrometry.
REFERENCES:
patent: 4406541 (1983-09-01), Tomoff et al.
patent: 4981357 (1991-01-01), Minakawa et al.
patent: 5155547 (1992-10-01), Casper et al.
patent: 5311277 (1994-05-01), Sasaki et al.
patent: 5383019 (1995-01-01), Farrell et al.
patent: 5424832 (1995-06-01), Nakano et al.
Honda Akira
Kojima Seiji
Hantis K.
Shimadzu Corporation
LandOfFree
Apparatus applied to spectroscopy does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus applied to spectroscopy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus applied to spectroscopy will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1977119