Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-07-04
2006-07-04
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07073154
ABSTRACT:
An interconnect zone cell resides within an integrated circuit laid out according to a layout. The integrated circuit includes a first circuit block, laid out according to a first minimum feature size. The integrated circuit further includes a second circuit block, laid out according to a second minimum feature size. The interconnect zone cell includes a coupler that couples a portion of the first circuit block to a portion of the second circuit block.
REFERENCES:
patent: 5161114 (1992-11-01), Akiyama
patent: 5410107 (1995-04-01), Schaper
patent: 5784292 (1998-07-01), Kumar
patent: 5896300 (1999-04-01), Raghavan et al.
patent: 6211697 (2001-04-01), Lien et al.
patent: 6297460 (2001-10-01), Schaper
patent: 6430733 (2002-08-01), Cohn et al.
patent: 6602735 (2003-08-01), Shyu
patent: 6760900 (2004-07-01), Rategh et al.
patent: 6820248 (2004-11-01), Gan
patent: 2001/0035568 (2001-11-01), Shyu
patent: 2002/0186106 (2002-12-01), Miller
Belshaw Mark
Garrison Dean
Altera Corporation
Fish & Neave IP Group Ropes & Gray LLP
Lin Sun James
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