Communications: radio wave antennas – Antennas – Wave guide type
Reexamination Certificate
2006-01-03
2006-01-03
Chen, Shih-Chao (Department: 2821)
Communications: radio wave antennas
Antennas
Wave guide type
C343S882000
Reexamination Certificate
active
06982678
ABSTRACT:
An apparatus includes a microwave source that produces a microwave feed beam, and a first pair of microwave sensors that each intercept and receive a portion of the microwave feed beam. The two microwave sensors are spaced apart from each other along a first-pair axis. A first phase-comparison device has as it inputs the output signals of the two microwave sensors, and as an output a first phase comparison of the first-sensor output signal and the second-sensor output signal. A first geometrical calculator has as an input the first phase comparison and as an output a geometrical relationship of the first-pair axis to an other feature. This geometrical relationship output may be used to generate a control signal that is used to alter the geometrical relationship. There may be additional microwave sensors operating in a similar manner but spaced to provide information for other geometrical axes or allow improvements in geometrical measurements.
REFERENCES:
patent: 4366483 (1982-12-01), Hagedon et al.
patent: 4524359 (1985-06-01), Champagne
patent: 4586050 (1986-04-01), Kuroda et al.
patent: 5457464 (1995-10-01), Scott et al.
patent: 6087985 (2000-07-01), Rummeli et al.
patent: 6252558 (2001-06-01), Brown et al.
patent: 6407806 (2002-06-01), Fujisawa et al.
patent: 6611236 (2003-08-01), Nilsson
Kai Chang, ed., Handbook of Microwave and Optical Components, Vol. 1, p. 153, John Wiley & Sons., Inc., 1989.
Merrill I. Skolnik, ed., Radar Handbook, second edition, pp. 3/36-3/37, McGraw Hill, 1990.
Brown Kenneth W.
Gallivan James R.
Gerstenberg John
Obert Thomas L.
Rattray Alan A.
Alkov Leonard A.
Chen Shih-Chao
Finn Thomas J.
Raytheon Company
Vick Karl A.
LandOfFree
Apparatus and method using wavefront phase measurements to... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method using wavefront phase measurements to..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method using wavefront phase measurements to... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3528321