Apparatus and method to overlay (N) first sectors onto (M)...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C710S022000

Reexamination Certificate

active

10912827

ABSTRACT:
A method to convert a plurality of sectors from a first sector format to a second sector format is disclosed. The method provides (N) contiguous first sectors comprising a first sector format to a sector format conversion device which includes a buffer and a data queue, where those (N) first sectors comprise a first number of bytes, and determines that (M) contiguous second sectors, comprising a second sector format, comprise at least the first number of bytes. The method overlays the (i)th first sector onto part or all of the (j)th second sector, and enqueues the newly-overlain (j)th second sector. The method then transmits the newly-overlain (j)th second sector to a data storage device, and writes that (j)th overlain second sector to an information storage medium.

REFERENCES:
patent: 5315691 (1994-05-01), Sumiya et al.
patent: 5627695 (1997-05-01), Prins et al.
patent: 5928367 (1999-07-01), Nelson et al.
patent: 5938771 (1999-08-01), Williams et al.
patent: 5940862 (1999-08-01), Erickson et al.
patent: 5946714 (1999-08-01), Miyauchi
patent: 6000018 (1999-12-01), Packer et al.
patent: 6357028 (2002-03-01), Zhu
patent: 6574699 (2003-06-01), Dobbek
patent: 2002/0087786 (2002-07-01), Burton et al.
patent: 2006/0028947 (2006-02-01), Elliott et al.
patent: 2006/0028948 (2006-02-01), Batchelor et al.
patent: 2006/0031601 (2006-02-01), Elliott et al.
patent: 2006/0031630 (2006-02-01), Batchelor et al.
patent: 2006/0031714 (2006-02-01), Batchelor et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and method to overlay (N) first sectors onto (M)... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method to overlay (N) first sectors onto (M)..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method to overlay (N) first sectors onto (M)... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3886482

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.