Apparatus and method of testing singulated dies

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S754090, C324S1540PB, C438S113000

Reexamination Certificate

active

07733106

ABSTRACT:
An exemplary die carrier is disclosed. In some embodiments, the die carrier can hold a plurality of singulated dies while the dies are tested. The dies can be arranged on the carrier in a pattern that facilities testing the dies. The carrier can be configured to allow interchangeable interfaces to different testers to be attached to and detached from the carrier. The carrier can also be configured as a shipping container for the dies.

REFERENCES:
patent: 4617586 (1986-10-01), Cuvilliers et al.
patent: 5180974 (1993-01-01), Mitchell et al.
patent: 5237268 (1993-08-01), Honma et al.
patent: 5367253 (1994-11-01), Wood et al.
patent: 5440241 (1995-08-01), King et al.
patent: 5621333 (1997-04-01), Long et al.
patent: 5634267 (1997-06-01), Farnworth et al.
patent: 5682064 (1997-10-01), Atkins et al.
patent: 5952840 (1999-09-01), Farnworth et al.
patent: 6002266 (1999-12-01), Briggs et al.
patent: 6118286 (2000-09-01), Fredrickson
patent: 6124725 (2000-09-01), Sato
patent: 6275051 (2001-08-01), Bachelder et al.
patent: 6313522 (2001-11-01), Akram et al.
patent: 6434503 (2002-08-01), Sommer
patent: 6529022 (2003-03-01), Pierce
patent: 6555400 (2003-04-01), Farnworth et al.
patent: 6577003 (2003-06-01), Crane, Jr. et al.
patent: 6777971 (2004-08-01), Kirloskar et al.
patent: 6851096 (2005-02-01), Alexander
patent: 6853209 (2005-02-01), Jovanovic et al.
patent: 6927083 (2005-08-01), Kline
patent: 6930499 (2005-08-01), Van Arendonk et al.
patent: 7046022 (2006-05-01), Richmond et al.
patent: 7247035 (2007-07-01), Mok et al.
patent: 2003/0206030 (2003-11-01), Wood et al.
patent: 2004/0061207 (2004-04-01), Ding
patent: 2004/0212389 (2004-10-01), Hamren et al.
patent: 2005/0161786 (2005-07-01), Zhuang
International Preliminary Report on Patentability PCT/US2006/036336 (Mar. 26, 2009) (10 pages).

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