4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Thin active physical layer which is
  6. Low workfunction layer for electron emission

David S. Hsu

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Apparatus and method of testing singulated dies

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Thin-film edge field emitter device

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Low workfunction layer for electron emission
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2074815

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