Apparatus and method of pattern recognition

Image analysis – Pattern recognition

Reexamination Certificate

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C382S118000

Reexamination Certificate

active

07454062

ABSTRACT:
In one embodiment of the invention, a pattern recognition apparatus comprises a unit for inputting a pattern of a to-be recognized category; and a processor with a memory for: generating input subspace; calculating and storing reference subspaces; storing constraint subspaces for extracting features; projecting the input subspace and the reference subspaces respectively onto the constraint subspaces; calculating similarities between the respective reference subspaces and the input subspace in such projected state; combining the similarities in respect of the constraint subspaces on each of the reference subspaces; and identifying the to-be recognized category with a category corresponding to one of the reference subspaces, if the combined similarity between the one of reference subspace and the input subspace is highest among them.

REFERENCES:
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patent: 6466685 (2002-10-01), Fukui et al.
patent: 2003/0161537 (2003-08-01), Maeda et al.
patent: 2003/0198366 (2003-10-01), Fukui et al.
patent: 2003/0215115 (2003-11-01), Kim et al.
Iwanami, “Suite Iryowokumiawaseru”, Toukeigakunofurontexia 6, Chap3, 2003, pp. 141-143.

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