Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-02-15
2008-09-09
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07424381
ABSTRACT:
An apparatus and method of estimating the quality of an input signal, and an optical disc driver including the apparatus for estimating the quality of the input signal, the signal quality estimating apparatus including a level value detection unit that detects level values of an input signal according to a binary signal of the input signal, an input signal composing unit that composes a plurality of ideal input signals by using the level values and a plurality of pre-defined binary signals, and a quality calculation unit that obtains a quality of the input signal according to a calculation between the plurality of ideal input signals.
REFERENCES:
patent: 4783807 (1988-11-01), Marley
patent: 6611794 (2003-08-01), Fleming-Dahl
patent: 2003/0043939 (2003-03-01), Okumura et al.
patent: 2003/0046037 (2003-03-01), Mashimo
patent: 2004/0264307 (2004-12-01), Wilhelmsson
patent: 2005/0041537 (2005-02-01), Tanaka et al.
PCT International Search Report and Written Opinion mailed Apr. 30, 2007 re: International Application No. PCT/KR2007/000805 (10 pp).
Bui Bryan
Samsung Electronics Co,. Ltd.
Stein, McEwen & Bui LLP
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