Electronic digital logic circuitry – Reliability
Reexamination Certificate
2005-01-04
2005-01-04
Tran, Anh Q. (Department: 2819)
Electronic digital logic circuitry
Reliability
C326S010000, C326S011000, C326S038000, C326S039000
Reexamination Certificate
active
06838899
ABSTRACT:
The present system comprises a radiation tolerant programmable logic device having logic modules and routing resources coupling together the logic modules. Configuration data lines providing configuration data control the programming of the logic modules and the routing resources. Error correction circuitry coupled to the configuration data lines analyzes and corrects any errors in the configuration data that may occur due to a single event upset (SEU).The present system also comprises a method for correcting errors in a programmable logic device having configuration data to program the programmable logic device. The method comprises a background reading of the configuration data. Next, the configuration data is analyzed for errors. Finally, the configuration data is then corrected and the configuration data is rewritten if errors are located.
REFERENCES:
patent: 4876220 (1989-10-01), Mohsen et al.
patent: 6104211 (2000-08-01), Alfke
patent: 6237124 (2001-05-01), Plants
patent: 6324102 (2001-11-01), McCollum
patent: 6492206 (2002-12-01), Hawley et al.
Actel Corporation
Sierra Patent Group Ltd.
Tran Anh Q.
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