Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-01-08
2008-01-08
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C703S002000
Reexamination Certificate
active
07318207
ABSTRACT:
A method for verifying layout interconnections includes extracting a loop circuit as a loop portion in a first circuit model. The first circuit model includes first branch interconnections included in the loop portion and second branch interconnections, first nodes, and terminals of circuit elements. The loop portion is replaced with a second node to generate a second circuit model which does not have a loop portion, based on the first circuit model. A second current value of each of the second branch interconnections is calculated, based on the second circuit model. A third circuit model of the loop portion is generated, based on the first interconnections. A first current value of each of the first branch interconnections is calculated, based on the third circuit model. The first and second current value are compared with a predetermined current value to carry out verification.
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Chiang Jack
Doan Nghia M.
Foley & Lardner LLP
NEC Electronics Corporation
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