Apparatus and method for verifying custom IC

Details Apparatus and method for verifying custom IC Apparatus and method for verifying custom IC

2006-05-18

2010-02-23

Ellis, Kevin L (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Testing of error-check system

C714S718000, C714S719000, C714S724000, C714S738000, C365S201000, C324S765010

Reexamination Certificate

active

07669090

ABSTRACT:
An apparatus for verifying a custom IC including a test pattern generating unit for generating a test pattern for verifying a function of the custom IC. The test pattern is output to a master IC and a test IC. The apparatus further includes a comparing unit connected to receive operation signals output from the master IC and the test IC for comparing the operation signals to see if the operation signals are agreed with each other and for generating a comparison signal based on a comparison result, a judging unit connected to receive the comparison signal for judging if there is any abnormality in the test IC and for outputting a judged signal based on a judged result, and a computer connected to receive the judged signal for displaying the judged result of the test IC.

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