Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2004-09-16
2008-11-25
Beausoliel, Robert (Department: 2113)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
Reexamination Certificate
active
07457986
ABSTRACT:
In a JTAG test and debug environment, the parameters that are accessed by command include a delay parameter. The delay parameter prevents the subsequent command from being executed until both the original command has been executed and the clock cycles indicated by the delay parameter have been completed. Because the time delay is included as a parameter identified by the command, the delay parameter can be programmed.
REFERENCES:
patent: 5479652 (1995-12-01), Dreyer et al.
patent: 5828824 (1998-10-01), Swoboda
patent: 6055649 (2000-04-01), Deao et al.
patent: 6546505 (2003-04-01), Swoboda et al.
patent: 6889344 (2005-05-01), Williams
patent: 7017081 (2006-03-01), Gomez
patent: 7100086 (2006-08-01), Kudo et al.
patent: 7231551 (2007-06-01), Treue et al.
Hoar Henry R.
Larson Lee A.
Beausoliel Robert
Brady III Wade J.
Riad Amine
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
LandOfFree
Apparatus and method for using variable end state delay to... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for using variable end state delay to..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for using variable end state delay to... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4049577