Apparatus and method for testing setup/hold time

Details Apparatus and method for testing setup/hold time Apparatus and method for testing setup/hold time

2008-12-30

2011-10-11

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

C714S718000, C714S731000, C327S141000, C327S149000, C327S170000, C327S269000, C327S270000

Reexamination Certificate

active

08037372

ABSTRACT:
An apparatus for testing setup/hold time includes a plurality of data input units, each configured to calibrate setup/hold time of input data in response to selection signals and setup/hold calibration signals, and an off-chip driver calibration unit configured to generate the selection signals and the setup/hold calibration signals by using the input data input of one of the plurality of data input units.

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