Apparatus and method for testing semiconductor chip

Details Apparatus and method for testing semiconductor chip Apparatus and method for testing semiconductor chip

2005-11-14

2008-09-02

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07420382

ABSTRACT:
An apparatus includes a test board for testing electrical characteristics of the semiconductor chip; socket pins vertically disposed on the test board to electrically connect the test board, and external terminals of the semiconductor chip; socket springs interposed between the socket pins and the test board and making the socket pins vertically elastic; a plurality of laser beam transmitters vertically penetrating the socket pins, the socket springs, and the test board; and a laser beam source supplying laser beams to the laser beam transmitters.

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patent: 2002-164136 (2002-06-01), None
patent: 2002-228682 (2002-08-01), None
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English language sbstract of Korean Publication No. 2002-73820.
English language abstract of Japanese Publication No. 2002-228682.
English language abstract of Japanese Publication No. 2002-257893.

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