Apparatus and method for testing conductive bumps

Details Apparatus and method for testing conductive bumps Apparatus and method for testing conductive bumps

2006-09-05

2006-09-05

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07102372

ABSTRACT:
Apparatus and method for testing conductive bumps. The apparatus for testing a plurality of conductive bumps with a single electrical pathway comprises a support substrate and a first probe, a second probe and a plurality of dual-probe sets respectively disposed in the support substrate, wherein each of the dual-probe sets comprises two electrically connected third probes.

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