Apparatus and method for testing a plurality of...

Details Apparatus and method for testing a plurality of... Apparatus and method for testing a plurality of...

2005-05-03

2005-05-03

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100, C714S724000

Reexamination Certificate

active

06888366

ABSTRACT:
A semiconductor chip test system and test method thereof are provided. The system having a plurality of data input/output pins, a tester for inputting/outputting data through the plurality of data input/output pins; a plurality of semiconductor chips to be tested by the tester; a control circuit for sequentially outputting the output data from each of the plurality of semiconductor chips to the tester during a read operation and simultaneously supplying the input data from the tester to the semiconductor chips during a write operation.

REFERENCES:
patent: 5675544 (1997-10-01), Hashimoto
patent: 5794175 (1998-08-01), Conner
patent: 6452411 (2002-09-01), Miller et al.
patent: 6466007 (2002-10-01), Prazeres da Costa et al.
patent: 6480978 (2002-11-01), Roy et al.

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