Apparatus and method for test-stimuli compaction

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C714S738000

Reexamination Certificate

active

09985768

ABSTRACT:
Based on the concept of minimization, a method of static compaction has been developed for a digital circuit. The compaction method is a combination of two main procedures: one for the selection of essential test stimuli and the other for the elimination of redundant test stimuli, and effective in minimizing any set of test stimuli without modifying any of the test stimuli.

REFERENCES:
patent: 5726996 (1998-03-01), Chakradhar et al.
patent: 5771243 (1998-06-01), Lee et al.
patent: 5987636 (1999-11-01), Bommu et al.
patent: 6212667 (2001-04-01), Geer et al.
patent: 6782501 (2004-08-01), Distler et al.
patent: 6810372 (2004-10-01), Unnikrishnan et al.
patent: 2002/0099991 (2002-07-01), Distler et al.
patent: 195 30 095 (1997-02-01), None
patent: 199 24 242 (1999-12-01), None
patent: 2000-214236 (2000-08-01), None
Kajihara et al., “Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits,” IEEE, Dec. 1995, pp. 1496-1504.
Guo et al., “On Improving Static Test Compaction of Sequential Circuits,” IEEE, Jan. 3-7, 2001, pp. 111-116.
Pomeranz et al, “Static Test Compaction for Synchronous Sequential Circiuts Based on Vector Restoration,” IEEE, Jul. 1999, pp. 1040-1049.
Pomeranz et al., “Vector Replacement to Improve Static-Test Compaction for Synchronous Sequential Circiuts,” IEEE, Feb. 2001, pp. 336-342.
Pomeranz et al., “Verse: A Vector Replacement Procedure for Improving Test Compaction in Synchronous Sequential Circuits,” IEEE, Jan. 7-10, 1999, pp. 1-6.
Higami et al., “Test Sequence Compaction for Sequential Circuits With Reset States,” IEEE, Dec. 4-6, 2000, pp. 165-170.
Pomeranz et al., “An Approach for Improving the Levels of Compaction Achieved by Vector Omission,” IEEE, Nov. 7-11, 1999, pp. 463-466.
Guo et al., “On Speeeding-Up Vector Restoration Based Static Compaction of Test Sequences fro Sequential Circuits,” IEEE, Dec. 1998, pp. 467-471.
Hsiao et al., “Fast Static Compaction Algorithms for Sequential Circuit Test Vectors,” IEEE, Mar. 1999, pp. 311-322.
Elizabeth et al., “Efficient Techniques for Dynamic Test Sequence Compaction,” IEEE, Mar. 1999, pp. 323-330.
Pomeranz et al., “On Static Compaction of Test Sequences for Synchronous Sequential Circuits,” ACM, 1996, pp. 1-6.
Hamzaoglu et al., “Test Set Compaction Algorithms for Combinational Circuits*,” ACM 1998, pp. 283-289.
Office Action for corresponding German Application No. 102 00833.7 dated Apr. 28, 2005.
K. O. Boateng, H. Takahashi and Y. Yakamatsu, “Diagnosing Delay Faults in Combinational Circuits Under the Ambiguous Delay Model,” IEICE Transaction on Information and Systems, vol. E82-D, No. 12, pp. 1563-1571, Dec. 1999.
K. O. Boateng, H. Takahashi, and Y. Takamatsu, “Multiple Gate Delay Fault Diagnosis Using Test-Pairs for Marginal Delays,” IEIEC Transaction on Information and Systems, vol. E81-D, No. 7, pp. 706-715, Jul. 1998.
N. Yanagida, H. Takahashi and Y. Takamatsu, “Multiple Fault Diagnosis By Sensitizing Input Pairs,” IEEE Design and Test of Computers, vol. 12, No. 3, pp. 44-52, no date.
I. Pomeranz and S. M. Reddy, “On Test Compaction Objectives for Combinational and Sequential Circuits,” Proceedings of IEEE International Conference on VLSI Design, pp. 279-284, 1997.
S. Kajihara and K. Saluja, “On Test Pattern Compaction Using Random Pattern Fault Simulation,” Proceedings of IEEE International Conference on VLSI Design, pp. 464-469, 1997.
I. Hamzaoglu and J. H. Patel, “Test Set Compaction Algorithms for Combinational Circuits,” Proceedings of ACM International Conference on CAD, pp. 283-289, 1995.
M. S. Hsiao and S. T. Chakradhar, “Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits,” Proceedings of the 7thIEEE Asian Test Symposium, pp. 452-457, 1998.
M. S. Hsiao and S. T. Chakradhar, “State Relaxation Based Subsequence Removal for Fast Static Compaction in Sequential Circuits,” Proceedings of Design, Automation, and Test in Europe Conf., pp. 557-582, 1998.
M. S. Hsiao and E. M. Rudnick and J. H. Patel, “Fast Algorithms For Static Compaction of Sequential Circuit Test Vectors,” Proceedings of IEEE VLSI Test Symposium, pp. 188-195, 1997.

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