Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Scanning capacitance microscopy or apparatus therefor – e.g.,...
Reexamination Certificate
2007-11-15
2010-12-21
Berman, Jack I (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
Particular type of scanning probe microscopy or microscope;...
Scanning capacitance microscopy or apparatus therefor, e.g.,...
C850S021000, C850S033000, C250S306000, C250S307000, C324S724000, C977S866000
Reexamination Certificate
active
07856665
ABSTRACT:
An apparatus and technique for measuring the electrical capacitance between a conducting tip of a scanning probe microscope and a sample surface is described. A high frequency digital vector network analyzer is connected to the probe tip of the cantilever of an atomic force microscope, and data collection is coordinated by a digital computer using digital trigger signals between the AFM controller and the vector network analyzer. Methods for imaging tip-sample capacitance and spectroscopic measurements at a single point on the sample are described. A method for system calibration is described.
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Hertzog William H.
Jones Keith M.
Moshar Amir A.
Rutgers Maarten
Asylum Research Corporation
Berman Jack I
Ippolito Rausch Nicole
Law Office of Scott C. Harris, Inc.
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