Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2009-03-10
2011-12-13
Tabatabai, Abolfazl (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C725S019000
Reexamination Certificate
active
08077979
ABSTRACT:
A pattern recognition method comprises steps of inputting a pattern of a recognition object performing feature extraction from the input pattern to generate a feature vector, increasing the number of quantization in an order from quantization number 1 or quantization number 2 to calculate a quantization threshold of each of the quantization number, wherein the quantization threshold of quantization number (n+1) using a quantization threshold of quantization number n (n>=1) is calculated and a quantization function having a quantization threshold corresponding to quantization number S (S>n) is generated, quantizing each component of the feature vector of the input pattern using the quantization function to generate an input quantization feature vector having each of the quantized component, storing a dictionary feature vector of the recognition object, or a quantized dictionary feature vector in which each component of the dictionary feature vector of the pattern of a recognition object is quantized; calculating a similarity between the input quantization feature vector and the dictionary feature vector, or a similarity between the input quantization feature vector and the quantized dictionary feature vector; and recognizing the recognition object based on the similarity.
REFERENCES:
patent: 4959870 (1990-09-01), Tachikawa
patent: 7327883 (2008-02-01), Polonowski
Duda et al., “Pattern Classification,” John Wiley & Sons, Inc. (2001), title and copyright pages only.
Cover et al., “Elements of Information Theory,” John Wiley & Sons, Inc. (2006), title and copyright pages, and pp. 118-123.
Duda et al., “Principal Component Analysis (PCA)”, Pattern Classification, Wiley-Interscience, Chapter 3, Section 3.8.1, pp. 115-117.
Lloyd. “Least Squares Quantization in PCM”, IEEE Transactions on Information Theory, vol. IT-28, No. 2, pp. 129-137, (1982).
Kawahara Tomokazu
Yamaguchi Osamu
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
Tabatabai Abolfazl
LandOfFree
Apparatus and method for pattern recognition does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for pattern recognition, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for pattern recognition will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4265486