Apparatus and method for partial ion implantation using atom...

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Reexamination Certificate

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Reexamination Certificate

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07968857

ABSTRACT:
A partial ion implantation apparatus and method are provided. The partial ion implantation apparatus includes an ion beam generator, a wafer chuck, and a plurality of atom-vibrating devices. The ion beam generator is configured to generate an ion beam. The wafer chuck is disposed to support a wafer into which the ion beam is implanted. The atom-vibrating devices are configured to vibrate silicon atoms in the wafer.

REFERENCES:
patent: 6111260 (2000-08-01), Dawson et al.
patent: 6869865 (2005-03-01), Maegawa et al.
patent: 7052981 (2006-05-01), Rouh et al.
patent: 20-0134904 (1998-10-01), None
patent: 10-2005-0050658 (2005-05-01), None
patent: 10-2007-0086877 (2007-08-01), None

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