4. Geometrical instruments
  5. Gauge
  6. Continuous gauging

Data Measurement Corporation

Corporate Assignee

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Corporate Assignee

active

No affiliations

Apparatus and method for measuring thickness

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Dynamic alloy correction gauge

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for measuring the thickness of a coating on

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Virtual two gauge profile system

Geometrical instruments – Gauge – Continuous gauging
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Data Measurement Corporation does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Data Measurement Corporation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Data Measurement Corporation will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-479825

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure