Optics: measuring and testing – Of light reflection
Patent
1997-05-30
2000-07-11
Font, Frank G.
Optics: measuring and testing
Of light reflection
356369, G01N 2155
Patent
active
060881151
ABSTRACT:
In an optical anisotropy measurement apparatus for emitting a light flux from a He-Ne laser to be incident to an object to be examined, such as a liquid crystal in a liquid crystal cell, and detecting a light flux totally reflected from the object to be examined to measure an optical anisotropy of the object, a portion of the incident light flux is designed to be incident at an angle smaller than a critical angle of total reflection to and transmitted through the object to be examined. As a result, a light flux-incident region causing total reflection at the boundary is allowed to have a shape closer to a circle and have a smaller size, thus allowing detection of a local alignment change in optical anisotropy as caused by, e.g., a minute alignment defect in a liquid crystal device. Further by detecting the transmitted portion of the incident light flux, an optical anisotropy of the object to be examined at a position other than a boundary thereof can be measured simultaneously.
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Takezoe, H., et al., "Experimental Studies on Reflection Spectra in Monodomain Cholesteric Liquid Crystal Calls: Total Reflection, Subsidiary Oscillation and Its Beat or Swell Structure," Japanese Journal of Applied Physics, vol. 22, No. 7, pp. 1080-1091 (Jul. 1983).
Yamashita, M., "Dependence of Temporal Behavior of Conoscopic Figures in Nematic Liquid Crystals on Film Thickness," Japanese Journal of Applied Physics, vol. 25, No. 1, pp. 1-7 (Jan. 1986).
Ohsaki Yoshinori
Suzuki Takashi
Canon Kabushiki Kaisha
Font Frank G.
Nguyen Tu T.
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