Apparatus and method for measuring electronic response of high s

Details Apparatus and method for measuring electronic response of high s Apparatus and method for measuring electronic response of high s

1981-08-14

1984-11-13

Levy, Stewart J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158D, G01R 3126

Patent

active

044828632

ABSTRACT:
Direct measurements of electronic device and material response times are made by using high speed photoconductors as both pulse generators and sampling gates.

REFERENCES:
patent: 3801910 (1974-04-01), Quinn
patent: 3956698 (1976-05-01), Malmberg et al.
patent: 4122383 (1978-10-01), von Roos
S. M. Faris, Applied Physics Letters, vol. 36, No. 12, "Generation and Measurement of Ultrashort Current Pulses with Josephson Devices," Jun. 15, 1980, pp. 1005-1007.
D. B. Tuckerman, Applied Physics Letters, vol. 36, No. 12, "A Josephson Ultrahigh-Resolution Sampling System," Jun. 15, 1980, pp. 1008-1010.
D. H. Auston, et al., Applied Physics Letters, vol. 37, No. 4, "Picosecond Optoelectronic Detection, Sampling, and Correlation Measurements in Amorphous Semiconductors," Aug. 15, 1980, pp. 371-373.

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