4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

James W. Wiskin

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Apparatus and method for imaging with wavefields using inverse s

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Apparatus and method for imaging with wavefields using inverse s

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Patent

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Profile ID: LFUS-PAI-P-742442

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