Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate
2006-02-21
2006-02-21
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
By polarized light examination
Of surface reflection
C356S445000, C436S517000, C436S805000
Reexamination Certificate
active
07002686
ABSTRACT:
Apparatus for acquiring an image of a specimen comprising a cassette having an optical portion holding a specimen array on a TIR surface and being removably matable to a processing portion having a polarized light beam source and a processing polarization-sensitive portion to image the spatially distributed charges in polarization of the specimen array. In one form the array optical portion comprises a transparent slide having a bottom surface with first and second gratings located to direct polarized light to the TIR surface and to direct light reflected by that (TIR) surface to an imager, respectively. The apparatus may include a flow cell integral with the optical portion as well as means for selecting the direction and wavelength of the polarized light.
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Kempen Lothar U.
Lieberman Robert A.
Ralin David
Rassman William
MacPherson Kwok Che & Heid LLP
Maven Technologies LLC
Park David S.
Pham Hoa Q.
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