Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-01-31
2006-01-31
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
06993733
ABSTRACT:
A system and method for implementation of look-ahead design methodology. Efficient debugging of a design is accomplished by evaluating the high level register transfer level (RTL) representation of a device being designed by quickly simulating the downstream implementation of that device to expose potential implementation problems that would otherwise be found much later in the design or manufacturing cycle.
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Atrenta Inc.
Garbowski Leigh M.
Sughrue & Mion, PLLC
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