Apparatus and method for fabricating semiconductor packages

Plastic and nonmetallic article shaping or treating: processes – With measuring – testing – or inspecting – Positioning of a mold part to form a cavity or controlling...

Reexamination Certificate

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C264S272170, C425S127000, C425S135000, C425S141000

Reexamination Certificate

active

07824585

ABSTRACT:
An apparatus for fabricating semiconductor packages may include a thickness measurer configured to measure the thickness of a printed circuit board (PCB); mold dies, clamped to the top and the bottom of the PCB, through which a molding compound may be injected; and a pressure controller configured to control a clamp pressure of the mold die in response to the thickness of the PCB. The thickness of the PCB may be measured before molding the PCB, and a clamp pressure corresponding to the measured thickness may be decided. Therefore, it is possible to adjust the thickness variation of a PCB in real time, as they are being produced, to decrease the number of bad packages.

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patent: 2005/0070047 (2005-03-01), Kuratomi et al.
patent: 2006/0093692 (2006-05-01), Miyajima et al.
patent: 08-316258 (1996-11-01), None
patent: 11-126786 (1999-05-01), None
patent: 2005-101407 (2005-04-01), None
patent: 100457420 (2004-11-01), None
patent: 10-2006-0052406 (2006-05-01), None

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