Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Patent
1997-09-23
2000-12-19
Lintz, Paul R.
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
G06F 700
Patent
active
061638749
ABSTRACT:
An apparatus and method for generating a sequence of random, repeatable events for testing a cloned device against the device from which it is derived. The invention includes elements used to double the speed at which the event generator produces the events. This allows the event generator to be used in the testing of devices, such as CPUs, which operate at relatively high clock rates.
REFERENCES:
patent: 4385349 (1983-05-01), Ashford
patent: 5313622 (1994-05-01), Truchard
patent: 5515383 (1996-05-01), Katoozi
patent: 5568407 (1996-10-01), Hass
patent: 5691917 (1997-11-01), Harrison
Do Thuan
Lintz Paul R.
National Semiconductor Corporation
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