Apparatus and method for directly measuring the density of a thi

Details Apparatus and method for directly measuring the density of a thi Apparatus and method for directly measuring the density of a thi

1984-12-13

1987-02-03

Howell, Janice A.

Radiant energy

Inspection of solids or liquids by charged particles

Including a radioactive source

2503581, 378 89, G01N 2300

Patent

active

046410309

ABSTRACT:
The present invention provides a nuclear radiation backscatter gauge which is capable of directly measuring the density of a thin top layer of material from a composite material comprised of the relatively thin top layer of material applied over an underlying base material. The gauge includes a nuclear radiation source and two radiation detector means so positioned with respect to the source as to form two geometrically differing source-to-detector relationships. A signal processing circuit responds to detected radiation from the two detector means to generate respective signals D.sub.G1 and D.sub.G2 representative of the components densities of the top and base layers as measured by the detector means. The density D.sub.T of the thin top layer is then determined by a signal processing means from the relationship ##EQU1## wherein k.sub.1 and k.sub.2 are empirically derived instrument constants.

REFERENCES:
patent: 4525854 (1985-06-01), Molbert et al.

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