Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent
1996-11-27
1999-02-09
Barlow, John
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
702122, G01R 3128
Patent
active
058706933
ABSTRACT:
An apparatus and a method for diagnosing any abnormality in a processing equipment without the necessity of professional knowledge of a user while ensuring enhanced general-purpose usability. In the apparatus, a computer is connected to a programmable logic controller for controlling the operation of a processing equipment which repeats a predetermined sequence of a plurality of steps, while monitoring information from the processing equipment changed in accordance with the operation in the equipment, thereby automatically detecting any abnormal state in the equipment. The computer comprises memory means for previously storing changes of the information of at least one sequence from the processing equipment in its normal operation; and automatic analysis means for acquiring the information from the processing equipment during its halt caused upon occurrence of any abnormality in the equipment, then comparing the acquired information with the information stored previously in the memory means, and executing an analysis of the abnormal state on the basis of the result of such comparison.
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Madenokoji Akihide
Seng Chin Chye
Shibasaki Tetsuro
Barlow John
Frommer William S.
Miller Craig Steven
Sony Display Device (Singapore) Pte. Ltd.
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