Static information storage and retrieval – Read/write circuit – Testing
Patent
1995-05-02
1996-06-11
Yoo, Do Hyun
Static information storage and retrieval
Read/write circuit
Testing
365 96, 36518907, 365210, 3652257, 257 50, 257530, G11C 1716
Patent
active
055263127
ABSTRACT:
An additional column (or row) track is provided in an antifuse based interconnect array containing circuit structures identical to the circuit structures in the remaining columns of the array, except that antifuse vias are filled with contact or via plugs. These plug antifuse substitutes are addressable in the same manner and by the same circuitry as the antifuses on the integrated circuit. The programmed antifuse is addressed, a test voltage is placed on the V.sub.pp input pin on the integrated circuit, and the current drawn by the antifuse is measured. The plug antifuse substitute is addressed, the test voltage is placed on the V.sub.pp input pin on the integrated circuit, and the current drawn by the plug antifuse substitute is measured. The resistance of the entire circuit path which includes the programmed antifuse is calculated using the test voltage and the measured antifuse current and the resistance of the entire circuit path which includes the plug antifuse substitute is calculated using the test voltage and the measured plug antifuse substitute current. The difference between the two resistance values is an accurate measure of the resistance of the programmed antifuse.
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Actel Corporation
Yoo Do Hyun
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