Apparatus and method for determining relative positional and...

Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Methods of use

Reexamination Certificate

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C351S205000, C351S206000, C351S221000, C382S287000, C382S294000

Reexamination Certificate

active

07040759

ABSTRACT:
Apparatus and methods can determine positional and rotational offsets between a first and second imaging device. Embodiments may determine the relative offsets between a Hartmann-Shack wavefront sensor and a pupil camera using a calibration apparatus having a rotationally asymmetric aperture. The image obtained by the Hartmann-Shack wavefront sensor way comprise a spot pattern that corresponds to a shape of the aperture. A marker may be superimposed over the images, with a shape of the marker substantially corresponding to the shape of the aperture, and movements of the marker from nominal positions on each image can be compared to determine the offsets.

REFERENCES:
patent: 3600098 (1971-08-01), Mohrman
patent: 3614238 (1971-10-01), Stites
patent: 4580042 (1986-04-01), Tokutomi et al.
patent: 4640619 (1987-02-01), Edmark, III
patent: 4672676 (1987-06-01), Linger
patent: 5220176 (1993-06-01), Kawai
patent: 5648854 (1997-07-01), McCoy et al.
patent: 5655030 (1997-08-01), Suzuki
patent: 5818954 (1998-10-01), Tomono et al.
patent: 5857120 (1999-01-01), Konishi
patent: 5960125 (1999-09-01), Michael et al.
patent: 6152563 (2000-11-01), Hutchinson et al.
patent: 6175750 (2001-01-01), Cook et al.
patent: 6271895 (2001-08-01), Takagi et al.
patent: 6343143 (2002-01-01), Guillemaud et al.
patent: 6396961 (2002-05-01), Wixson et al.
patent: 6637884 (2003-10-01), Martino
patent: 6671049 (2003-12-01), Silver

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