Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2007-12-14
2010-06-01
Lam, David (Department: 2827)
Static information storage and retrieval
Read/write circuit
Testing
C365S200000, C365S230060, C365S189140
Reexamination Certificate
active
07729185
ABSTRACT:
The apparatus comprises derived address generation circuitry, responsive to a base address portion of each base address, to generate an associated series of derived addresses. Each derived address is different from other derived addresses in that associated series and has a derived address portion that differs from the corresponding base address portion by a single address bit value. Read/write sequence generator circuitry is then responsive to each base address in turn, to write in said memory device a first data value at the base address and a second data value at each derived address in the associated series of derived addresses and is arranged to read a data value stored at the base address each time the second data value is written to one of the derived addresses, and to detect an address decoder open fault if the read data value is the second data value.
REFERENCES:
patent: 6400621 (2002-06-01), Hidaka et al.
Shirur Rajshekhar Veeranna
Surulivel Murugeswaran
ARM Limited
Lam David
Nixon & Vanderhye P.C.
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