Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2003-07-29
2008-11-25
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S718000, C365S185250, C365S185300, C365S185330, C365S201000
Reexamination Certificate
active
07457997
ABSTRACT:
An apparatus and method for detecting an over-programming condition in a multistate memory cell. The invention is also directed to identifying the over-programmed cells and providing an alternate location at which to write the data intended for the over-programmed cell. An over-programmed state detection circuit generates an error signal when the data contained in a multistate memory cell is found to be over-programmed relative to its intended programming (threshold voltage level) state. Upon detection of an over-programmed cell, the programming operation of the memory system is modified to discontinue further programming attempts on the cell. The over-programmed state detection circuit is also used to assist in correcting for the over-programming state, permitting the programming error to be compensated for by the memory system.
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Chevallier Christophe J.
Norman Robert D.
Britt Cynthia
Micro)n Technology, Inc.
Schwegman Lundberg & Woessner, P.A.
Tabone, Jr. John J
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