Special receptacle or package – Combined or convertible – Packaged assemblage or kit
Reexamination Certificate
2005-01-11
2005-01-11
Tucker, Philip (Department: 1712)
Special receptacle or package
Combined or convertible
Packaged assemblage or kit
C428S447000, C428S450000, C428S145000, C428S688000
Reexamination Certificate
active
06840374
ABSTRACT:
A probe cleaning apparatus for cleaning a probe tip use to test semiconductors dies having an abrasive substrate layer an a tacky gel layer on top of the abrasive surface of the abrasive substrate layer. The probe tip is cleaned by passing it through the tacky gel layer so that it comes in contact with the abrasive surface of the abrasive substrate, moving the probe tip across the abrasive surface of the substrate layer, and then removing the probe tip from the successive layers of the cleaning apparatus. The probe tip emerges from the cleaning apparatus free from debris associated with testing the semiconductor dies.
REFERENCES:
patent: 4757255 (1988-07-01), Margozzi
patent: 4774111 (1988-09-01), Lo
patent: 4778326 (1988-10-01), Althouse et al.
patent: 4954774 (1990-09-01), Binet
patent: 5198752 (1993-03-01), Miyata et al.
patent: 5198753 (1993-03-01), Hamburgen
patent: 5220279 (1993-06-01), Nagasawa
patent: 5476211 (1995-12-01), Khandros
patent: 5568054 (1996-10-01), Iino et al.
patent: 5690749 (1997-11-01), Lee
patent: 5834946 (1998-11-01), Albrow et al.
patent: 5917707 (1999-06-01), Khandros et al.
patent: 6056627 (2000-05-01), Mizuta
patent: 6110823 (2000-08-01), Eldridge et al.
patent: 6130104 (2000-10-01), Yamasaka
patent: 6140616 (2000-10-01), Andberg
patent: 6169409 (2001-01-01), Amemiya
patent: 6184053 (2001-02-01), Eldridge et al.
patent: 6255126 (2001-07-01), Mathieu et al.
patent: WO 9514314 (1995-05-01), None
patent: WO 9617378 (1996-06-01), None
patent: WO 0033089 (2000-06-01), None
patent: WO 0108819 (2001-02-01), None
Buckholtz Christopher C.
Drush Michael A.
Eldridge Benjamin N.
Fang Treliant
Grube Gary W.
Feely Michael J
Tucker Philip
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