Apparatus and method for automatically testing a multiple node e

Details Apparatus and method for automatically testing a multiple node e Apparatus and method for automatically testing a multiple node e

1981-09-08

1984-07-03

Strecker, Gerard R.

Electricity: measuring and testing

Plural, automatically sequential tests

G01R 1512, G01R 3102

Patent

active

044581971

ABSTRACT:
Each of a plurality of circuit node voltages is sampled at high speed with quadrature mode samples being stored at every quarter wavelength of a reference waveform and spurt mode samples stored over a quarter wave of a reference waveform. The stored signals are processed to determine whether the sampled waveform is DC, AC, AC on DC, digital or noise and whether it is within a tolerance value. If the sampled signal is outside of tolerance the circuit node is slow sampled and compared to a reference tolerance. If an out-of-tolerance condition still persists, the testing apparatus makes an internal check of its circuitry. A failure at the node is indicated if the internal check determines that the testing apparatus is operating properly.

REFERENCES:
patent: 4196386 (1980-04-01), Phelps
patent: 4290013 (1981-09-01), Thiel
patent: 4342959 (1982-08-01), Skilling

Affiliated with

Also associated with

Rating

Apparatus and method for automatically testing a multiple node e does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for automatically testing a multiple node e, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for automatically testing a multiple node e will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1632364