Apparatus and method for analyzing post-layout timing...

Details Apparatus and method for analyzing post-layout timing... Apparatus and method for analyzing post-layout timing...

2006-01-10

2008-09-02

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000

Reexamination Certificate

active

07421674

ABSTRACT:
A critical path detecting unit for detecting critical paths for a design in which cells are placed on an integrated circuit and information concerning timing constraints. A representative-critical-path extracting unit extracts a representative critical path by having one critical path represent critical paths which share more intervals than a certain number, and which are similar to one another, out of critical paths which have been detected by the critical path detecting unit. A path-image generating unit renders the representative critical path, which has been extracted by the representative-critical-path extracting unit and reflects information concerning other critical paths, which are similar to the representative critical path, on the representative critical path.

REFERENCES:
patent: 4970664 (1990-11-01), Kaiser et al.
patent: 5636372 (1997-06-01), Hathaway et al.
patent: 6058252 (2000-05-01), Noll et al.
patent: 6249901 (2001-06-01), Yuan et al.
patent: 6347074 (2002-02-01), Croslin et al.
patent: 6412096 (2002-06-01), Ventrone
patent: 7194721 (2007-03-01), Slonim et al.
patent: 2004/0019450 (2004-01-01), Berthold et al.
patent: 2004/0019473 (2004-01-01), Burden et al.
patent: 6-282597 (1996-02-01), None
patent: 8-50608 (1996-02-01), None

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