Apparatus and method for analyzing post-layout timing...

Details Apparatus and method for analyzing post-layout timing... Apparatus and method for analyzing post-layout timing...

2008-09-02

2008-09-02

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000

Reexamination Certificate

active

11328708

ABSTRACT:
A critical path detecting unit for detecting critical paths for a design in which cells are placed on an integrated circuit and information concerning timing constraints. A representative-critical-path extracting unit extracts a representative critical path by having one critical path represent critical paths which share more intervals than a certain number, and which are similar to one another, out of critical paths which have been detected by the critical path detecting unit. A path-image generating unit renders the representative critical path, which has been extracted by the representative-critical-path extracting unit and reflects information concerning other critical paths, which are similar to the representative critical path, on the representative critical path.

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