Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2004-07-06
2008-11-18
Garbowski, Leigh Marie (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C703S014000
Reexamination Certificate
active
07454725
ABSTRACT:
The invention is aimed to analyze the characteristics of a transmission line only by inputting the specific distributed parameters without mesh dividing the transmission line to be analyzed into minimal unit required for the analysis. An arithmetic operation section12solves a differential equation regarding electromagnetic interaction of each line segment based on the predetermined distributed parameters, including a distributed self-inductance Li, a distributed resistance Ri, and a distributed capacitance ciand a distributed conductance giin relation to a reference potential plane in the transmission line, and a distributed mutual inductance Mij, a distributed capacitance Cij, and a distributed conductance Gijbetween the transmission line and another transmission line, which are input from an input section11, and calculates the characteristic data of the transmission line.
REFERENCES:
patent: 6567955 (2003-05-01), Yamaguchi
patent: 2002/0147575 (2002-10-01), Bois et al.
Griffith et al., “State-Variable Simulation of Transients on Transmission Lines,” 1989 IEEE, pp. 600-602.
Nelms et al., “Simulation of Transmission Line Transients Using Personal Computer,” 1988 IEEE, pp. 229-232.
Tanji et al., “Passive Closed-Form Expression of RLCG Transmission Lines,” 2002 IEEE, pp. 795-798.
Sato Toshiro
Yanagisawa Koichi
Zhang Fuchun
Garbowski Leigh Marie
Hioki Denki Kabushiki Kaisha
Kanesaka Manabu
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