Aperture piece and method for calibrating backscatter thickness

Details Aperture piece and method for calibrating backscatter thickness Aperture piece and method for calibrating backscatter thickness

1981-03-20

1984-03-13

Howell, Janice A.

Radiant energy

Inspection of solids or liquids by charged particles

Including a radioactive source

2502521, 2503581, G01N 2300, G01D 1800

Patent

active

044370008

ABSTRACT:
An aperture piece to be used in conjunction with backscatter instruments for measuring the thickness of a coating on a substrate of a concave workpiece. The aperture piece being selectively shaped so that a sample support surface, including an aperture through which radiation from a radioisotope is transmitted, may be inserted into the interior space defined by the concave workpiece to engage the concave surface. A method of calibrating backscatter instruments using the aperture piece to make correction for the failure to have a planar mating relation between the sample support surface and the concave workpiece.

REFERENCES:
patent: 3319067 (1967-05-01), Joffe et al.
patent: 3456115 (1969-07-01), Lieber et al.
patent: 3714436 (1973-01-01), Fischer
patent: 4155009 (1979-05-01), Lieber et al.
patent: 4317997 (1982-03-01), Tiebor et al.

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