Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2003-12-18
2009-02-17
Nguyen, Thanh T. (Department: 2813)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C427S568000
Reexamination Certificate
active
07491659
ABSTRACT:
In forming various types of insulating films in manufacture of a semiconductor device, carbon is gasified into CHx, COH etc. during film formation by adding active hydrogen and nitrogen oxide to reduce the carbon content during the film formation, and the effect of blocking impurities such as alkali metals is improved.
REFERENCES:
patent: 4196232 (1980-04-01), Schnable et al.
patent: 4527007 (1985-07-01), Fuse
patent: 4830890 (1989-05-01), Kanai
patent: 5057187 (1991-10-01), Shinagawa et al.
patent: 5290609 (1994-03-01), Horiike et al.
patent: 5314724 (1994-05-01), Tsukune et al.
patent: 5344797 (1994-09-01), Pai et al.
patent: 5354698 (1994-10-01), Cathey, Jr.
patent: 5374847 (1994-12-01), Araki et al.
patent: 5382550 (1995-01-01), Iyer
patent: 5474955 (1995-12-01), Thakur
patent: 5480684 (1996-01-01), Sandhu
patent: 5567271 (1996-10-01), Chu et al.
patent: 5593741 (1997-01-01), Ikeda
patent: 5608232 (1997-03-01), Yamazaki et al.
patent: 5629246 (1997-05-01), Iyer
patent: 5639698 (1997-06-01), Yamazaki et al.
patent: 5773201 (1998-06-01), Fujimura et al.
patent: 5828084 (1998-10-01), Noguchi et al.
patent: 5837614 (1998-11-01), Yamazaki et al.
patent: 5843225 (1998-12-01), Takayama et al.
patent: 5866932 (1999-02-01), Yamazaki et al.
patent: 5879977 (1999-03-01), Zhang et al.
patent: 5885361 (1999-03-01), Kikuchi et al.
patent: 5897347 (1999-04-01), Yamazaki et al.
patent: 5956579 (1999-09-01), Yamazaki et al.
patent: 6001431 (1999-12-01), Itoh et al.
patent: 6025630 (2000-02-01), Yamazaki et al.
patent: 6084247 (2000-07-01), Yamazaki et al.
patent: 6110770 (2000-08-01), Zhang et al.
patent: 6168980 (2001-01-01), Yamazaki et al.
patent: 6228751 (2001-05-01), Yamazaki et al.
patent: 6323142 (2001-11-01), Yamazaki et al.
patent: 6706648 (2004-03-01), Yamazaki et al.
patent: 2005/0003568 (2005-01-01), Yamazaki et al.
patent: 0 518 000 (1992-12-01), None
patent: 59-11629 (1984-01-01), None
patent: 64-48425 (1989-02-01), None
patent: 03-162219 (1991-07-01), None
patent: 03-190229 (1991-08-01), None
patent: 4-96226 (1992-03-01), None
patent: 04-235282 (1992-08-01), None
patent: 04-343456 (1992-11-01), None
patent: 05-063208 (1993-03-01), None
patent: 05-090247 (1993-04-01), None
patent: 05-175132 (1993-07-01), None
patent: 05-239649 (1993-09-01), None
patent: 06-124890 (1994-05-01), None
patent: 06-132219 (1994-05-01), None
patent: 06-168937 (1994-06-01), None
patent: 06-232059 (1994-08-01), None
patent: 06-244103 (1994-09-01), None
patent: 06-244104 (1994-09-01), None
patent: 06-267982 (1994-09-01), None
patent: 06-333740 (1994-12-01), None
patent: 07-130668 (1995-05-01), None
patent: 09-008033 (1997-01-01), None
patent: 1992-018872 (1992-10-01), None
patent: 239225 (1995-01-01), None
Wolf et al. “silicon processing for the vlsi era” 1986, vol. 1, pp. 183-194.
Han, et al., “Dependence of MOSFET Hot-Carrie Aging on PECVD Oxide Process”, Proc. SPIE-Int. Soc. Opt. Eng., vol. 2636, pp. 299-306 (1995).
Ibarki, N., “15.1:Invited Paper:Low-Temperature Poly-Si TFT Technology”, SID 99 Digest, pp. 172-175 (1999).
Mori, et al., “Silica Coating of Powdered Material in Atmospheric Pressure Glow Plasma”, Symp. Plasma Sci. Mater., 8thpp. 51-55 (1995).
Fukada Takeshi
Sakama Mitsunori
Yamazaki Shunpei
Fish & Richardson P.C.
Nguyen Thanh T.
Semiconductor Energy Laboratory Co,. Ltd.
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