Electronic digital logic circuitry – Multifunctional or programmable – Having details of setting or programming of interconnections...
Reexamination Certificate
2001-02-21
2002-04-02
Tokar, Michael (Department: 2819)
Electronic digital logic circuitry
Multifunctional or programmable
Having details of setting or programming of interconnections...
C326S010000, C326S047000
Reexamination Certificate
active
06366118
ABSTRACT:
FIELD OF THE INVENTION
The invention relates generally to a repair circuit using an antifuse, and more particularly to, an antifuse repair circuit having a special address multiplexer for repairing defective cells.
BACKGROUND OF THE INVENTION
A conventional repair technology employs a laser repair method by which a poly fuse is blown by lasers in the state of a wafer. The packaged memory devices experience a final test, which is performed after a burn-in stress is applied. The test shows that about 5% to about 15% are defective. As the products are packaged, however, it is impossible to use a laser repair method. In order to reduce these defective products, a repair technology using an antifuse has been developed. In order to implement this antifuse, every antifuse in the antifuse box requires a specific address. As the antifuse is programmed one by one, many addresses must be decoded in order to implement a specific address.
However, as one antifuse box includes 22 (twenty-two) fuses, the number of fuses becomes very great. As a result, there is a problem in manufacturing a memory chip since a large number of address pins must be added.
REFERENCES:
patent: 6301164 (2001-10-01), Manning et al.
patent: 6317370 (2001-11-01), Shirley
Kim Phil Jung
Lee Chang Hyuk
Oh Jin Keun
Wee Jae Kyung
Hyundai Electronics Industries Co,. Ltd.
Marshall Gerstein & Borun.
Tokar Michael
Tran Anh Q.
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