Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of...
Reexamination Certificate
2004-08-27
2009-10-06
Lindsay, Jr., Walter L (Department: 2812)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
C430S270100, C438S952000, C252S501100
Reexamination Certificate
active
07598182
ABSTRACT:
There is provided an anti-reflective coating forming composition for use in a lithography and for forming an anti-reflective coating that can be developed with an alkaline developer for photoresist, and a method for forming photoresist pattern by use of the anti-reflective coating forming composition. Concretely, the composition comprises a polyamic acid produced from a tetracarboxylic dianhydride compound and a diamine compound having at least one carboxyl group, a compound having at least two epoxy groups, and a solvent.
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Enomoto Tomoyuki
Hatanaka Tadashi
Kimura Shigeo
Lindsay, Jr. Walter L
Nissan Chemical Industries Ltd.
Oliff & Berridg,e PLC
Patel Reema
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