Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2007-03-21
2010-12-28
Tran, Andrew Q (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S225700, C365S156000, C365S154000
Reexamination Certificate
active
07859925
ABSTRACT:
A programmable latch circuit (200) can include a volatile latch (206) that may regenerate a value determined by programmable section (202). In a test operation, a variable current source (216′) can generate a current (IBASE) that can be mirrored in test sections (252-0and252-1) and compared to a current drawn by either programmable element (210-0) or (210-1) by a latching operation of volatile latch (206). Variable current source (216′) can enable characterization of programmable elements (210-0or210-1) as well as adjustable test threshold limits. A program voltage (Vprog) applied to programmable elements (210-0or210-1) can be also be variable to allow for characterization of programmable elements (210-0and210-1) over a range of voltages.
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Cypress Semiconductor Corporation
Tran Andrew Q
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