Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate
2008-03-04
2008-03-04
Dinh, Son (Department: 2824)
Static information storage and retrieval
Read/write circuit
Having fuse element
C365S200000, C365S201000
Reexamination Certificate
active
11343341
ABSTRACT:
A programmable latch circuit (100) can include a programmable data circuit (104) with a data load path (116) that can enable a data value to be recalled into a volatile latch (102). A data load path (116) can be formed with devices (P100-P102) having low threshold voltages. Data can be loaded via data load path at lower power supply voltages levels, such as on power-on and/or reset operations. Other embodiments disclose, self-test circuits, full redundancy capabilities, and resistors for limiting current draw in an anti-fuse program operation.
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Fox Ken
Jenne Frederick
Kouznetzov Igor
Stansell Galen
Cypress Semiconductor Corporation
Dinh Son
Haverstock & Owens LLP
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