Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-02-28
2006-02-28
Vu, Hung (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S383000, C257S401000, C257S412000
Reexamination Certificate
active
07005713
ABSTRACT:
An annular segment MOSFET structure has reduced drain electric fields for a given applied voltage and dimensional sizing for improved reliability from damage by reducing high energy hot carriers laterally traversing the channel by reducing the intensity of electric fields in the MOSFET structure by creating diverging electric field lines with decreased electric field strength at the drain, while enabling compact integrated layouts of multiple MOSFETs within a square area of surface silicon.
REFERENCES:
patent: 3803461 (1974-04-01), Beneking
King Everett E.
Lacoe Ronald C.
Mayer Donald C.
Osborn Jon V.
Reid Derrick Michael
The Aerospace Corporation
Vu Hung
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