Anisotropic etching method and etchant

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156662, 252 791, 252 794, C09K 1300

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049293010

ABSTRACT:
The present invention is directed toward an improved etching solution which is a five component system and does not use ethylene-diamine. This etch will preferentially etch lightly doped, single crystalline silicon at an etch rate of 0.6 microns per minute .+-.0.05 microns per minute and will effectively stop at a selectively doped level in the silicon body being etched because the etch rate of this selectively doped level drops from 0.6 microns per minute to between 0.001 microns per minute and 0.0006 microns per minute. The etch is comprised of ethanol-amine, piperidine, water, pyrocatechol and 30% hydrogen peroxide. The solution preferably consists of 28 mls. ethanol-amine, 2 mls. piperidine, 5.5 mls. water, 5.5 grams pyrocatechol and 0.25 mls. hydrogen peroxide. If desired a trace of a long chain surfactant can be added to the solution.

REFERENCES:
patent: 3457107 (1969-07-01), Mickelson et al.
patent: 3650957 (1972-03-01), Shipley et al.
patent: 3873203 (1975-03-01), Stevenson
patent: 4229979 (1980-10-01), Greenwood
patent: 4293373 (1981-10-01), Greenwood
patent: 4342817 (1982-08-01), Bohlen et al.
patent: 4417946 (1983-11-01), Bohlen et al.
IBM Technical Disclosure Bulletin, vol. 15, No. 1, Jun. 1972, p. 173, "Metallic Free Organic Aluminum Etchant", A. J. Hoeg et al.
IBM Technical Disclosure Bulletin, vol. 19, #10, Mar. 1977, p. 3953, "Anisotropic Etching Solution with High Etch Rate On . . .", E. F. Baran et al.
IBM Technical Disclosure Bulletin, vol. 19, #9, Feb. 1977, p. 3623, "Controlled Anisotropic Etching of Single Crystal Silicon", E. Bassous.

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