Anisotropic etch process for tungsten metallurgy

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156646, 156664, 156656, 156667, 357 71, B44C 122

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047863609

ABSTRACT:
A method for anisotropically etching a thick tungsten layer atop a thin underlayer comprised of titanium nitride, by exposure to a gaseous plasma comprised of a binary mixture of chlorine gas and oxygen, wherein oxygen comprises approximately 25%-45% of the mixture by volume. This plasma provides a combination of high tungsten etch rate, highly uniform etching, anisotropic profiles, and high etch rate ratio to underlaying glass passivation layers.

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patent: 4478678 (1984-10-01), Watnabe
patent: 4568410 (1986-02-01), Thornquist
patent: 4637129 (1987-01-01), Derkits, Jr. et al.
"Blanket CVD Tungsten Interconnect for VLSI Devices," Metha et al., 1986 Proceedings 3rd International IEEE VLSI Multilevel Interconnection Conference, Santa Clara, Calif., Jun. 9-10, 1986, pp. 418-435.
"Selective Dry Etching of Tungsten for VLSI Metallization," Burba et al., Journal of the Electrochemical Society: LSP Solid State Science and Technology, Oct. 1986, pp. 2113-2118.

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