Analytical placement method and apparatus

Details Analytical placement method and apparatus Analytical placement method and apparatus

2006-03-06

2009-02-17

Kik, Phallaka (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07493581

ABSTRACT:
Some embodiments provide an analytical placement method that considers diagonal wiring. This method formulates an objective function that accounts for the use of diagonal wiring during routing. Some embodiments use horizontal, vertical, and ±45° diagonal lines. For such a wiring model, some embodiments use the following objective function:Function=∑n⁢∑p⁡(n)⁢bi,j⁡(12⁢(β+(xi-xj)2+β+(yi-yj)2)+(1-12)⁢β+(xi-xj)2+(yi-yj)2-2⁢(xi-xj)2⁢(yi-yj)2β+(xi-xj)2⁢(yi-yj)2)In this equation, n represents a net, p(n) represents a unique pair of pins i and j of the net n, x and y represent the x-, and y-coordinates of a particular pin, and bi,jrepresents a weighting factor that biases the function based on the desired closeness of pins i and j.

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