Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-06-06
2006-06-06
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07058913
ABSTRACT:
Some embodiments provide an analytical placement method that considers diagonal wiring. This method formulates an objective function that accounts for the use of diagonal wiring during routing. Some embodiments use horizontal, vertical, and ±45° diagonal lines. For such a wiring model, some embodiments use the following objective function:Function=∑n∑p(n)bi,j(12(β+(xi-xj)2+β+(yi-yj)2)+(1-12)β+(xi-xj)2+(yi-yj)2-2(xi-xj)2(yi-yj)2β+(xi-xj)2(yi-yj)2)In this equation, n represents a net, p(n) represents a unique pair of pins i and j of the net n, x and y represent the x-, and y-coordinates of a particular pin, and bi,jrepresents a weighting factor that biases the function based on the desired closeness of pins i and j, and β represents a smoothing parameter.
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Etawil Hussein
Siegel Andrew
Teig Steven
Cadence Design Systems Inc.
Kik Phallaka
Smith Matthew
Stattler Johansen & Adeli LLP
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